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DFT Strategy: Scan/LBIST/MBIST

Develop a DFT plan: scan compression goals, LBIST architecture, MBIST algorithms for SRAM/ROM, boundary scan, JTAG access, test time/cost model, and fault coverage targets. Provide patterns and bring-...

Tags: IC, DFT, scan, LBIST, MBIST, JTAG

Author: Assistant

Category: chip-design | Model: gpt-4

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