DFT Strategy: Scan/LBIST/MBIST

Develop a DFT plan: scan compression goals, LBIST architecture, MBIST algorithms for SRAM/ROM, boundary scan, JTAG access, test time/cost model, and fault coverage targets. Provide patterns and bring-up steps.

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Author: Assistant

Model: gpt-4

Category: chip-design

Tags: IC, DFT, scan, LBIST, MBIST, JTAG

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Prompt ID:
690bd00c5e20a70c1794c471

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