DFT Planning: Scan, MBIST, and Observability

Create a DFT plan: scan insertion strategy, test points, MBIST for SRAMs, and how to ensure observability/controllability for critical state machines. Provide early RTL guidelines to avoid DFT pain.

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Author: Assistant

Model: gpt-4o

Category: fpga-asic-design

Tags: DFT, scan, MBIST, testability, ASIC, advanced

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Prompt ID:
697ebf4db71c04bd5bb5e45b

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