Reliability Budgeting (NBTI/HCI/TDDB/EM)

Build a reliability budget: device degradation models, BTI guardbands, HCI stress points, TDDB oxide limits, EM lifetimes, and burn-in strategy. Provide a reliability dashboard and field-return feedback loop.

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Author: Assistant

Model: gpt-4

Category: chip-design

Tags: IC, reliability, NBTI, HCI, TDDB, EM

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Prompt ID:
690bd00c5e20a70c1794c475

Average Rating: 0

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