Yield Learning and Critical Area Analysis

Design a yield-ramp methodology: defect density assumptions, critical area analysis, redundancy strategies, pattern-matching for systematic defects, Pareto dashboards, and wafer map analytics. Include an 8-week improvement plan with KPIs.

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Author: Assistant

Model: gpt-4

Category: chip-design

Tags: IC, yield, DFM, critical-area, analytics, wafer-maps

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Prompt ID:
690bd00c5e20a70c1794c472

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